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On site we have access to an SJ400 contacting profilometer from Mitutoyo.


This machine employs a fine stylus to stroke over the surface under examination, providing measurements to sub micron levels of accuracy.

We also have access to a scanning electron microscope with EDAX capability to further investigate areas of interest.

Submicron characterisation of surfaces

Surface Topography

Surface Topography

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Northern Retrieval Re

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